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Product Details:
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| Place of Origin: | Suzhou, China |
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| Brand Name: | GoGo |
| Certification: | ISO 9001:2015 / ISO 14001:2015 / ISO 45001:2018 |
| Model Number: | SCH200-RS |
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Payment & Shipping Terms:
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| Minimum Order Quantity: | 1 |
| Price: | CNY 30000~600000/set |
| Packaging Details: | Cardboard box + wooden box |
| Delivery Time: | 30~60 work days |
| Payment Terms: | T/T |
| Supply Ability: | 1set/day |
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Detail Information |
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| Name: | Hot And Cold Stage | Cooling/Heating Method: | Liquid Nitrogen Cooling,Resistance Heating |
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| Temperature Range: | -180℃~200℃ | Temperature Stability: | ±0.1℃ |
| Heating/Cooling Rate: | Maximum Heating Rate:30℃/min,Maximum Cooling Rate:15℃/min | Sample Holder: | Copper ;φ30mm |
| Dimensions: | 100mm*41mm*36.5mm | Net Weight: | 0.2kg |
| Basic Configuration: | TNEX*1、SEM Rotating Heating And Cooling Stage*1、 Cooling Controller*1、Liquid Nitrogen Tank*1、Cables、Tubing、and Accessories | Optional: | Adapter Plate/Customized Liquid Nitrogen Tank/Computer Host/ Customed Temperature Control Software |
| Highlight: | Five Axis Hot And Cold Stage,SEM Temperature Controlled Stage,Five Axis Temperature Controlled Stage |
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Product Description
Five-Axis Cryo/Heating SEM Sample Stage with Non-Invasive Integration and -180℃~200℃ Temperature Range for FIB/SEM
The GoGo SCH200-RS is an advanced, multi-axis SEM Sample Stage engineered to revolutionize in-situ experiments within focused ion beam (FIB) and scanning electron microscope (SEM) systems. It provides precise five-axis (X/Y/Z/R/T) positioning control, enabling unparalleled flexibility to translate, rotate, and tilt the sample under the electron/ion beam. Coupled with a broad temperature range from -180°C to 200°C and excellent stability (±0.1°C), this stage allows researchers to perform complex nanomanipulation, cross-sectioning, and dynamic observation of thermal processes from any optimal angle. Designed for non-invasive integration and featuring superior electromagnetic interference (EMI) shielding, this specialized SEM Sample Stage is the ultimate tool for correlative microscopy and advanced materials research at the nanoscale.
Unmatched Five-Axis Positioning Flexibility: This SEM Sample Stage provides comprehensive X, Y, Z translation, 360° rotation (R), and tilt (T), allowing you to optimally orient your sample for FIB milling, EBSD analysis, or high-resolution imaging without breaking vacuum or temperature conditions.
Optimized for Integrated FIB/SEM Workflows: Specifically designed for dual-beam systems, the stage's compact mechanics and precise control enable intricate in-situ experiments such as lamella preparation at specific temperatures, observation of thermal effects on nanostructures, or mechanical testing within the chamber.
Non-Invasive Integration with Full Performance: Like our other stages, it integrates via a custom external flange, requiring no internal modification to your FIB/SEM. Its robust EMI shielding ensures no interference with sensitive electron/ion optics, detectors, or gas injection systems (GIS).
Precision Thermal Control for Dynamic Studies: Delivers stable thermal environments from cryogenic to moderate-high temperatures. The integrated control system allows for precise ramps and holds, enabling real-time study of phase changes, thin-film reactions, or polymer behavior under the beam.
Certified, Application-Focused Design: Manufactured under ISO 9001, 14001, and 45001 certified processes, this SEM Sample Stage is built to meet the rigorous demands of nanotechnology research, providing reliability for complex, long-duration in-situ experiments.
| Parameter | Specification |
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| Model / Brand | SCH200-RS / GoGo |
| Core Feature | 5-Axis Positioning (X, Y, Z, Rotation, Tilt) for FIB/SEM |
| Integration | Non-Invasive, External Flange |
| Temperature Range | -180°C to 200°C |
| Temperature Stability | ±0.1°C |
| Positioning | X/Y/Z/R/T Full Motion Control |
| Key Application | In-Situ Nanomanipulation & Cross-Sectioning in FIB/SEM |
| Sample Holder | Copper, φ30mm |
Target Markets & Clients
This sophisticated SEM Sample Stage is critical for cutting-edge research facilities in key regions including Southeast Asia, the Middle East, Russia, and Africa. It is an essential instrument for university nanotechnology centers, corporate R&D labs in semiconductors and advanced materials, and government research institutes utilizing dual-beam FIB/SEM systems.
What is the primary benefit of five-axis positioning in an SEM Sample Stage?
It allows you to position any specific region of a sample into the ideal geometry for the task—whether for perpendicular FIB milling, achieving optimal EBSD tilt, or aligning a feature for high-resolution imaging—all without manual handling, saving immense time and preserving experiment integrity.
Is this stage compatible with all major FIB/SEM brands?
Yes. The SEM Sample Stage is designed with a universal integration philosophy. We provide customized flange solutions and adapter plates to ensure compatibility with systems from leading manufacturers like Thermo Fisher (FEI), Zeiss, TESCAN, and Hitachi.
Can I perform in-situ lift-out or nanoprobing with this stage?
Absolutely. The combination of precise multi-axis movement and temperature control makes this stage ideal for complex in-situ workflows, including heating/cooling a sample during nanoprobing electrical tests or maintaining a lamella at a specific temperature during transfer.
Does the motion or heating generate vibration that affects imaging?
No. The stage is engineered for smooth, stable motion and incorporates effective vibration isolation. Combined with its EMI shielding, this ensures that both imaging resolution and analytical precision are maintained during all operations.
What is included to get started?
The package includes the five-axis SEM Sample Stage assembly, a custom vacuum flange for your specific chamber port, a cooling controller for liquid nitrogen management, a liquid nitrogen tank, TNEX control software, and all necessary cables and accessories for immediate integration.
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