As semiconductor devices grow increasingly complex, engineers face mounting challenges in achieving precise and efficient wafer-level testing while pursuing ultimate performance and reliability.

STAr Technologies, a pioneer in semiconductor testing solutions, has introduced a comprehensive lineup of high-performance probe stations designed to address these industry demands and empower research and production processes.

Cost-Effective 150mm Wafer Testing: Magic-A150e

The Magic-A150e adaptive engineering probe station offers exceptional value for 150mm wafer testing. Combining user-friendly operation with high-speed performance, this solution supports flexible configuration with various optical and electrical measurement instruments. It accommodates diverse requirements for wafer size, thermal range, and microscope options, delivering reliable results for both basic parameter testing and complex device characterization.

Reliable 200mm Wafer Testing: Magic-A200e

Engineered specifically for 200mm wafers, the Magic-A200e adaptive engineering probe station ensures precise measurements for critical applications including device characterization, wafer-level reliability evaluation, failure analysis, and high-speed component wafer sorting. Its stable performance and advanced design make it an ideal choice for high-quality 200mm wafer testing.

Precision Solutions for 300mm Wafer Testing

STAr Technologies offers multiple precision engineering probe stations that set new industry standards for 300mm wafer testing with unparalleled accuracy and stability.

Magic-P300m: Unmatched Precision Across Temperature Ranges

This premium probe station delivers exceptional step accuracy and operates across wide temperature ranges, making it ideal for device characterization, high-power device testing, RF measurements, wafer-level reliability testing, and failure analysis in demanding environments.

Magic-P300e: High-Performance Engineering Testing

The Magic-P300e serves as a robust solution for device characterization, wafer-level reliability verification, SPICE model extraction, and yield improvement, offering outstanding stability and precision for research applications.

Magic-X300e: Semi-Automated Efficiency

This semi-automated probe solution supports testing from DC to RF, microwave, optoelectronic devices, and even superconducting magnetic measurements, significantly improving throughput while maintaining accuracy.

Magic-X300a: Fully Automated Future

Designed for complete 300mm wafer automation, the Magic-X300a performs comprehensive testing from DC to RF, microwave, and optoelectronic devices, including superconducting magnetic measurements, dramatically enhancing production efficiency.

Specialized Probe Systems for Advanced Applications

Sagittarius-SPT: Silicon Photonics Testing

This fully automated system provides wafer-level testing for silicon photonic devices, enabling high-precision characterization and acceptance testing for this emerging technology.

Unicorn-LAIT II: Integrated LED Testing

A high-throughput solution for Mini- and Micro-LED probe testing, featuring precise micro-pad control and needle force adjustment for reliable LED production testing.

Precision Accessories for Enhanced Testing

Capricorn-MP: Multi-Chip Probe Positioner

This 6-axis precision positioner accommodates probe cards with up to 26 probes, suitable for standard parameter testing or high-temperature reliability evaluations, ensuring test accuracy through fine control.

STAr Technologies continues to drive semiconductor industry advancement through innovative testing solutions, equipping engineers with the tools needed to overcome technical challenges and push technological boundaries.