In the relentless pursuit of semiconductor performance, precise measurement of materials and devices under extreme conditions has become paramount. Imagine the challenge of accurately detecting every subtle electrical characteristic of a chip at temperatures approaching absolute zero or in high-temperature, high-pressure vacuum environments. Consider the difficulty of simulating harsh space conditions to validate the reliability of optoelectronic devices.

The SCG Series Cryogenic Vacuum Probe Station emerges as a groundbreaking solution to these cutting-edge challenges. As the first domestically developed cryogenic vacuum probing system, the SCG Series integrates ultra-high vacuum technology, precision automation, and advanced laser simulation capabilities, representing years of technical expertise and innovation.

The SCG Series offers unparalleled versatility, meeting rigorous demands from fundamental research to product validation across several key areas:

• Chip Testing: Comprehensive evaluation of electrical performance for integrated circuits, microprocessors, and memory chips under varying temperatures and vacuum conditions, including critical parameters like leakage current, threshold voltage, and transconductance.
• Optoelectronic Device Testing: Precise photoelectric measurements for laser diodes (LD), light-emitting diodes (LED), and photodetectors (PD), assessing luminous efficiency, response speed, spectral characteristics, and performance degradation under extreme temperatures.
• Fiber Optic Spectral Testing: Evaluation of transmission loss, dispersion, and other optical parameters under different temperature and vacuum conditions, crucial for building stable optical communication networks.
• IV/CV Characteristics Testing: In-depth analysis of current-voltage and capacitance-voltage properties to reveal carrier transport mechanisms, band structures, and interface characteristics.
• Hall Effect Testing: Measurement of Hall coefficient, carrier concentration, and mobility with minimized thermal noise and surface effects.
• Electromagnetic Transport Testing: Investigation of complex transport behaviors under combined electric/magnetic fields and temperature variations.
• High-Frequency Characteristics Testing: Assessment of high-frequency response and impedance properties under precisely controlled vacuum and temperature conditions.

The SCG Series achieves its exceptional performance through several technological breakthroughs:

Capable of reaching 10^-10 torr, minimizing surface adsorption and contamination while simulating space-like conditions.

Features XYZ three-dimensional adjustment with 2μm positioning accuracy and ultra-low current leakage (as low as 100fAN @25°C).

Incorporates high-resolution microscopy with 7:1 zoom ratio (4μm resolution) or optional metallurgical microscope (20X-1000X).

Operates from 77K to 473K (extendable to 4.2K) with 0.001K resolution and ±0.1K stability.

Specialized platform effectively isolates external vibrations for high-sensitivity measurements.

The SCG Series represents a significant advancement in high-end semiconductor testing equipment, providing researchers with unprecedented capabilities to explore quantum effects in new semiconductor materials, develop more efficient optoelectronic devices, and conduct reliability verification under extreme conditions. This innovative platform continues to push the boundaries of scientific discovery and technological innovation.