High Stability Microscope Probe Stage with ±0.1℃ Temperature Stability and Wide -190℃ to 400℃ Range in Vacuum Chamber

商品の詳細:
起源の場所: 中国、蘇州
ブランド名: GoGo
証明: ISO 9001:2015 / ISO 14001:2015 / ISO 45001:2018
モデル番号: ECH400V
お支払配送条件:
最小注文数量: 1
価格: CNY 30000~600000/set
パッケージの詳細: ダンボール箱+木箱
受渡し時間: 30~60営業日
支払条件: T/T
供給の能力: 1セット/日
接触 今雑談しなさい

詳細情報

サンプルホールド: シルバー ;23mm*23mm 冷却/加熱方法: 液体窒素冷却、抵抗加熱
窓上面からサンプルホルダー上面までの距離: 7.5mm 窓材: JGS2 石英ガラス (透過範囲: 220 nm ~ 2500 nm)、手動で取り外しおよび交換可能。
プローブポート: BNC*4 チャンバーの高さ: 6.5mm
チャンバー: 真空 上部ウィンドウのサイズ: φ25mm×1mm
下部ウィンドウのサイズ: φ10mm*1mm(透過光オプション) 光学道: 反射・透過(φ2mm光アクセスホール)
基本構成: TNEX*1、電気加熱冷却ステージ*1、温度コントローラー*1、冷却コントローラー*1、液体窒素タンク*1、循環チラー*1、ケーブル、チューブ、および付属品 温度範囲: -190℃~400℃
熱する/冷却率: 最大加熱速度:150℃/min、最大冷却速度:40℃/min 窓の霜取り: ガスパージアタッチメント、エアブロー低温霜取り
寸法/正味重量: 160mm*150mm*30mm/160mm*150mm*30mm(ジャバラなし);1.5kg/1.6kg サンプルステージの可能性: 接地または電気的にフローティング
Optiona: アダプタープレート/カスタマイズされた液体窒素タンク/カスタマイズされた再循環チラー/真空システム/カスタマイズされたプローブ/カスタマイズされたプローブポート/コンピュータホスト/カスタマイズされた プローブ: 固定プローブホルダー*4 + 金メッキタングステン鋼プローブ*4
温度安定性: ±0.1℃ 名前: プロービングステージ
ハイライト:

Microscope probe stage with temperature stability

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Probe stage for vacuum chamber

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Wide temperature range probe stage

製品の説明

High-Stability Microscope Probe Stage with Wide Temperature Range -190℃ to 400℃ and ±0.1℃ Stability for Electrical Characterization

Product Name: GoGo ECH400V High-Stability Microscope Probe Stage for Dielectric Material Analysis
Product Overview

The GoGo ECH600/ECH400V is a state-of-the-art Microscope Probe Stage engineered for the precise electrical characterization of materials under extreme thermal conditions. Operating across a wide range from -190°C to 600°C with exceptional stability of ±0.1°C, this system is specifically designed for the electrical testing of dielectric materials, semiconductors, and thin films. It integrates a high-performance thermal platform with a sophisticated four-probe electrical measurement system, allowing simultaneous in-situ property analysis and high-resolution microscope observation. Controlled via the unified TNEX software, this Probe Stage is an indispensable tool for R&D in advanced electronics and material science.

Core Advantages & Your Rationale for Selection
  • Dedicated to Electrical Property Analysis: This Probe Stage is optimized for correlating electrical behavior with temperature. It enables direct measurement of resistivity, breakdown voltage, and other key parameters of dielectrics and electronic materials within a controlled environment.

  • Uncompromising Thermal and Measurement Precision: Achieves rapid heating/cooling (150°C/min heat, 40°C/min cool) while maintaining ±0.1°C stability. The four gold-plated tungsten probes, mounted on magnetic holders, offer superb positional resolution for accurate and repeatable electrical contacts.

  • Comprehensive Observation and Flexibility: Features both reflection and transmission optical paths with high-quality JGS2 windows, facilitating concurrent optical microscopy or spectroscopic study. The chamber supports vacuum or atmospheric conditions, and a gas purge system prevents window frosting.

  • Intelligent, Integrated Control Ecosystem: The TNEX software serves as the central command hub, seamlessly synchronizing temperature profiles with data acquisition from external source measurement units connected via the four BNC ports, streamlining complex experiments.

  • Certified Quality and Tailored Solutions: Manufactured under ISO 9001, 14001, and 45001 certifications. We offer extensive customization for probes, ports, and vacuum systems, ensuring this Probe Stage meets your exact experimental requirements.

Technical Specifications
Parameter Specification
Model ECH400V 
Temperature Range -190°C to 400°C
Temperature Stability ±0.1°C
Max Heating/Cooling Rate Heat: 150°C/min; Cool: 40°C/min
Electrical Probes 4 x Magnetic Holders with Gold-plated Tungsten Probes
Electrical Interface 4 x BNC Ports; Stage can be Grounded or Floating
Optical Path Reflection & Transmission (φ2mm access)
Control Software TNEX Platform
Serving Global Innovation Hubs

This advanced Probe Stage is a vital asset for research institutions and industries in key growth regions, including Southeast Asia, the Middle East, Russia, and Africa. It is particularly valuable for university research groups, corporate R&D labs, and national scientific facilities focused on next-generation electronics, energy materials, and nanotechnology.

Frequently Asked Questions (FAQ)
  1. Why is this Probe Stage ideal for dielectric material testing?
    Its combination of a sealed, controllable atmosphere, precise temperature stability, and integrated high-quality probes allows for reliable and repeatable measurement of sensitive electrical properties like permittivity and loss tangent as functions of temperature.

  2. How are the electrical measurements performed with this stage?
    The Probe Stage provides the thermal environment and probe contacts. Users connect their own source meters, impedance analyzers, or semiconductor parameter analyzers to the BNC ports. The TNEX software can synchronize the thermal steps with measurement commands sent to these external instruments.

  3. Can the stage accommodate different sample sizes or probe configurations?
    Yes. The standard silver holder suits most samples. Furthermore, the Probe Stage design allows for customization of probe types (e.g., different tip materials or geometries) and holders to adapt to specific sample geometries or measurement needs.

  4. What is required to operate this stage in a vacuum?
    An optional vacuum system, including fittings and a pump, can be added. The chamber is designed to be sealed, enabling high-vacuum or controlled-gas experiments for sensitive materials.

  5. What does the basic configuration include?
    The system is supplied as a complete workstation, including the main probe stage, separate temperature and cooling controllers, a liquid nitrogen tank, a recirculating chiller, TNEX software, and all essential cables and connectors for immediate operation.

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