High Stability Microscope Probe Stage with ±0.1℃ Temperature Stability and Wide -190℃ to 400℃ Range in Vacuum Chamber

제품 상세 정보:
원래 장소: 중국 수즈 후
브랜드 이름: GoGo
인증: ISO 9001:2015 / ISO 14001:2015 / ISO 45001:2018
모델 번호: ECH400V
결제 및 배송 조건:
최소 주문 수량: 1
가격: CNY 30000~600000/set
포장 세부 사항: 판지 상자 + 나무 상자
배달 시간: 30~60 근무일
지불 조건: 티/티
공급 능력: 1세트/일
지금 연락 지금 챗팅하세요

상세 정보

샘플 홀데: 실버; 23mm*23mm 냉각/가열 방식: 액체질소 냉각, 저항가열
창 상단 표면에서 샘플 홀더 상단 표면까지의 거리: 7.5mm 창 재료: JGS2 용융 실리카 유리(전송 범위: 220 nm - 2500 nm), 수동으로 제거 및 교체 가능.
프로브 포트: BNC*4 챔버 높이: 6.5mm
방: 진공 상단 창 크기: 25mm*1mm
하단 창 크기: Φ10mm*1mm(투과광 옵션) 광학 경로: 반사/투과(Φ2mm 광 액세스 홀)
기본 구성: TNEX*1, 전기 가열 및 냉각 단계*1, 온도 컨트롤러*1, 냉각 컨트롤러*1, 액체 질소 탱크*1, 순환 냉각기*1, 케이블, 튜브 및 액세서리 온도 범위: -190℃~400℃
난방/냉방 비율: 최대 가열 속도: 150℃/min, 최대 냉각 속도: 40℃/min 창문 성에 제거: 가스 퍼지 부착, 저온에서 송풍하는 제상
치수/순중량: 160mm*150mm*30mm/160mm*150mm*30mm(벨로우즈 제외);1.5kg/1.6kg 샘플 단계 잠재력: 접지 또는 전기적으로 부동
옵션아: 어댑터 플레이트/맞춤형 액체 질소 탱크/맞춤형 재순환 냉각기/진공 시스템/맞춤형 프로브/맞춤형 프로브 포트/컴퓨터 호스트/맞춤형 온도 제어 소프트웨어 조사: 고정 프로브 홀더*4 + 금도금 텅스텐강 프로브*4
온도 안정성: ± 0.1 ℃ 이름: 프로빙 단계
강조하다:

Microscope probe stage with temperature stability

,

Probe stage for vacuum chamber

,

Wide temperature range probe stage

제품 설명

High-Stability Microscope Probe Stage with Wide Temperature Range -190℃ to 400℃ and ±0.1℃ Stability for Electrical Characterization

Product Name: GoGo ECH400V High-Stability Microscope Probe Stage for Dielectric Material Analysis
Product Overview

The GoGo ECH600/ECH400V is a state-of-the-art Microscope Probe Stage engineered for the precise electrical characterization of materials under extreme thermal conditions. Operating across a wide range from -190°C to 600°C with exceptional stability of ±0.1°C, this system is specifically designed for the electrical testing of dielectric materials, semiconductors, and thin films. It integrates a high-performance thermal platform with a sophisticated four-probe electrical measurement system, allowing simultaneous in-situ property analysis and high-resolution microscope observation. Controlled via the unified TNEX software, this Probe Stage is an indispensable tool for R&D in advanced electronics and material science.

Core Advantages & Your Rationale for Selection
  • Dedicated to Electrical Property Analysis: This Probe Stage is optimized for correlating electrical behavior with temperature. It enables direct measurement of resistivity, breakdown voltage, and other key parameters of dielectrics and electronic materials within a controlled environment.

  • Uncompromising Thermal and Measurement Precision: Achieves rapid heating/cooling (150°C/min heat, 40°C/min cool) while maintaining ±0.1°C stability. The four gold-plated tungsten probes, mounted on magnetic holders, offer superb positional resolution for accurate and repeatable electrical contacts.

  • Comprehensive Observation and Flexibility: Features both reflection and transmission optical paths with high-quality JGS2 windows, facilitating concurrent optical microscopy or spectroscopic study. The chamber supports vacuum or atmospheric conditions, and a gas purge system prevents window frosting.

  • Intelligent, Integrated Control Ecosystem: The TNEX software serves as the central command hub, seamlessly synchronizing temperature profiles with data acquisition from external source measurement units connected via the four BNC ports, streamlining complex experiments.

  • Certified Quality and Tailored Solutions: Manufactured under ISO 9001, 14001, and 45001 certifications. We offer extensive customization for probes, ports, and vacuum systems, ensuring this Probe Stage meets your exact experimental requirements.

Technical Specifications
Parameter Specification
Model ECH400V 
Temperature Range -190°C to 400°C
Temperature Stability ±0.1°C
Max Heating/Cooling Rate Heat: 150°C/min; Cool: 40°C/min
Electrical Probes 4 x Magnetic Holders with Gold-plated Tungsten Probes
Electrical Interface 4 x BNC Ports; Stage can be Grounded or Floating
Optical Path Reflection & Transmission (φ2mm access)
Control Software TNEX Platform
Serving Global Innovation Hubs

This advanced Probe Stage is a vital asset for research institutions and industries in key growth regions, including Southeast Asia, the Middle East, Russia, and Africa. It is particularly valuable for university research groups, corporate R&D labs, and national scientific facilities focused on next-generation electronics, energy materials, and nanotechnology.

Frequently Asked Questions (FAQ)
  1. Why is this Probe Stage ideal for dielectric material testing?
    Its combination of a sealed, controllable atmosphere, precise temperature stability, and integrated high-quality probes allows for reliable and repeatable measurement of sensitive electrical properties like permittivity and loss tangent as functions of temperature.

  2. How are the electrical measurements performed with this stage?
    The Probe Stage provides the thermal environment and probe contacts. Users connect their own source meters, impedance analyzers, or semiconductor parameter analyzers to the BNC ports. The TNEX software can synchronize the thermal steps with measurement commands sent to these external instruments.

  3. Can the stage accommodate different sample sizes or probe configurations?
    Yes. The standard silver holder suits most samples. Furthermore, the Probe Stage design allows for customization of probe types (e.g., different tip materials or geometries) and holders to adapt to specific sample geometries or measurement needs.

  4. What is required to operate this stage in a vacuum?
    An optional vacuum system, including fittings and a pump, can be added. The chamber is designed to be sealed, enabling high-vacuum or controlled-gas experiments for sensitive materials.

  5. What does the basic configuration include?
    The system is supplied as a complete workstation, including the main probe stage, separate temperature and cooling controllers, a liquid nitrogen tank, a recirculating chiller, TNEX software, and all essential cables and connectors for immediate operation.

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