High Stability Microscope Probe Stage with ±0.1℃ Temperature Stability and Wide -190℃ to 400℃ Range in Vacuum Chamber

جزئیات محصول:
محل منبع: سوژو ، چین
نام تجاری: GoGo
گواهی: ISO 9001:2015 / ISO 14001:2015 / ISO 45001:2018
شماره مدل: ECH400V
پرداخت:
مقدار حداقل تعداد سفارش: 1
قیمت: CNY 30000~600000/set
جزئیات بسته بندی: جعبه مقوایی + جعبه چوبی
زمان تحویل: 30 تا 60 روز کاری
شرایط پرداخت: T/T
قابلیت ارائه: 1 مجموعه در روز
اکنون تماس بگیرید حالا حرف بزن

اطلاعات تکمیلی

نمونه هولد: نقره‌ای 23*23 میلی‌متر روش سرمایش/گرمایش: خنک کننده نیتروژن مایع، گرمایش مقاومتی
فاصله از سطح بالایی پنجره تا سطح بالایی نگهدارنده نمونه: 7.5 میلی متر متریال پنجره: شیشه سیلیسی ذوب شده JGS2 (محدوده انتقال: 220 نانومتر - 2500 نانومتر)، به صورت دستی قابل جابجایی و تع
پورت پروب: BNC*4 ارتفاع اتاقک: 6.5 میلی متر
اتاق: وکیوم اندازه پنجره بالا: φ25mm*1mm
اندازه پنجره پایین: φ10mm*1mm (گزینه نور عبوری) مسیر نوری: بازتاب / انتقال (ف2 میلی متر سوراخ دسترسی نوری)
پیکربندی پایه: TNEX*1، مرحله گرمایش و سرمایش الکتریکی*1، کنترل کننده دما*1، کنترل کننده خنک کننده*1، مخزن نیتروژن م محدوده دما: -190℃~400℃
میزان گرمایش/سرمایش: حداکثر نرخ گرمایش: 150 ℃ در دقیقه، حداکثر سرعت سرمایش: 40 ℃ در دقیقه یخ زدایی پنجره: ضمیمه پاکسازی گاز، یخ زدایی دمنده هوا در دمای پایین
ابعاد/وزن خالص: 160mm*150mm*30mm/160mm*150mm*30mm (بدون دم)؛ 1.5kg/1.6kg پتانسیل مرحله نمونه: زمین یا شناور الکتریکی
گزینه: صفحه آداپتور / مخزن نیتروژن مایع سفارشی / چیلر چرخشی سفارشی / سیستم خلاء / پروب سفارشی / پورت پروب س کاوشگر: دارندگان پروب ثابت*4 + پروب های فولادی تنگستن با روکش طلا*4
پایداری دما: 0.1 ℃ نام: مرحله پروبینگ
برجسته کردن:

Microscope probe stage with temperature stability

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Probe stage for vacuum chamber

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Wide temperature range probe stage

توضیحات محصول

High-Stability Microscope Probe Stage with Wide Temperature Range -190℃ to 400℃ and ±0.1℃ Stability for Electrical Characterization

Product Name: GoGo ECH400V High-Stability Microscope Probe Stage for Dielectric Material Analysis
Product Overview

The GoGo ECH600/ECH400V is a state-of-the-art Microscope Probe Stage engineered for the precise electrical characterization of materials under extreme thermal conditions. Operating across a wide range from -190°C to 600°C with exceptional stability of ±0.1°C, this system is specifically designed for the electrical testing of dielectric materials, semiconductors, and thin films. It integrates a high-performance thermal platform with a sophisticated four-probe electrical measurement system, allowing simultaneous in-situ property analysis and high-resolution microscope observation. Controlled via the unified TNEX software, this Probe Stage is an indispensable tool for R&D in advanced electronics and material science.

Core Advantages & Your Rationale for Selection
  • Dedicated to Electrical Property Analysis: This Probe Stage is optimized for correlating electrical behavior with temperature. It enables direct measurement of resistivity, breakdown voltage, and other key parameters of dielectrics and electronic materials within a controlled environment.

  • Uncompromising Thermal and Measurement Precision: Achieves rapid heating/cooling (150°C/min heat, 40°C/min cool) while maintaining ±0.1°C stability. The four gold-plated tungsten probes, mounted on magnetic holders, offer superb positional resolution for accurate and repeatable electrical contacts.

  • Comprehensive Observation and Flexibility: Features both reflection and transmission optical paths with high-quality JGS2 windows, facilitating concurrent optical microscopy or spectroscopic study. The chamber supports vacuum or atmospheric conditions, and a gas purge system prevents window frosting.

  • Intelligent, Integrated Control Ecosystem: The TNEX software serves as the central command hub, seamlessly synchronizing temperature profiles with data acquisition from external source measurement units connected via the four BNC ports, streamlining complex experiments.

  • Certified Quality and Tailored Solutions: Manufactured under ISO 9001, 14001, and 45001 certifications. We offer extensive customization for probes, ports, and vacuum systems, ensuring this Probe Stage meets your exact experimental requirements.

Technical Specifications
Parameter Specification
Model ECH400V 
Temperature Range -190°C to 400°C
Temperature Stability ±0.1°C
Max Heating/Cooling Rate Heat: 150°C/min; Cool: 40°C/min
Electrical Probes 4 x Magnetic Holders with Gold-plated Tungsten Probes
Electrical Interface 4 x BNC Ports; Stage can be Grounded or Floating
Optical Path Reflection & Transmission (φ2mm access)
Control Software TNEX Platform
Serving Global Innovation Hubs

This advanced Probe Stage is a vital asset for research institutions and industries in key growth regions, including Southeast Asia, the Middle East, Russia, and Africa. It is particularly valuable for university research groups, corporate R&D labs, and national scientific facilities focused on next-generation electronics, energy materials, and nanotechnology.

Frequently Asked Questions (FAQ)
  1. Why is this Probe Stage ideal for dielectric material testing?
    Its combination of a sealed, controllable atmosphere, precise temperature stability, and integrated high-quality probes allows for reliable and repeatable measurement of sensitive electrical properties like permittivity and loss tangent as functions of temperature.

  2. How are the electrical measurements performed with this stage?
    The Probe Stage provides the thermal environment and probe contacts. Users connect their own source meters, impedance analyzers, or semiconductor parameter analyzers to the BNC ports. The TNEX software can synchronize the thermal steps with measurement commands sent to these external instruments.

  3. Can the stage accommodate different sample sizes or probe configurations?
    Yes. The standard silver holder suits most samples. Furthermore, the Probe Stage design allows for customization of probe types (e.g., different tip materials or geometries) and holders to adapt to specific sample geometries or measurement needs.

  4. What is required to operate this stage in a vacuum?
    An optional vacuum system, including fittings and a pump, can be added. The chamber is designed to be sealed, enabling high-vacuum or controlled-gas experiments for sensitive materials.

  5. What does the basic configuration include?
    The system is supplied as a complete workstation, including the main probe stage, separate temperature and cooling controllers, a liquid nitrogen tank, a recirculating chiller, TNEX software, and all essential cables and connectors for immediate operation.

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