Wide Temperature Probe Stage High Precision Hot And Cold Stage For Integrated Optical Electrical Measurement

The GoGo ECH600 is a high-precision Probe Stage specifically engineered for the comprehensive electrical and optical analysis of sensitive devices such as OLEDs, LEDs, and photodetectors across an extreme temperature spectrum. It enables researchers to study the electroluminescent properties of OLED devices and other optoelectronics under controlled conditions from deep cryogenic -190°C up to 600°C. This integrated system combines stable four-point electrical probing with superior optical access, and is optionally equipped with custom silicon photodiode optical modules for in-situ spectral response measurement (190~1100nm). As a versatile Probe Stage, it provides the essential platform for correlating electrical performance with optical emission or absorption as a function of temperature.

• Unmatched Temperature Range for Device Reliability Testing: This Probe Stage is designed to push devices to their operational limits, testing performance and degradation from extreme cold to high heat, which is critical for automotive, aerospace, and consumer electronics applications.

• Integrated Optical-Electrical Measurement: The stage’s top and bottom optical windows, combined with optional integrated silicon photodiodes, allow for simultaneous electrical biasing and real-time measurement of light intensity or spectral shifts, a unique capability for OLED and photonics research.

• Stable, Low-Noise Probing Environment: Equipped with four fixed, gold-plated tungsten probes for reliable electrical contact and an optional gas purge system to prevent window frosting. This ensures stable, low-noise measurements even during long-duration or cryogenic experiments.

• Complete, Automated Characterization Workflow: Controlled by the powerful TNEX software, the system automates complex test sequences, synchronizing temperature ramps with electrical measurements (via BNC-connected source meters) and optional optical data acquisition.

• Certified Quality for Demanding Research: Manufactured under ISO 9001, 14001, and 45001 certified processes, this robust Probe Stage ensures reliable, repeatable performance in rigorous academic and industrial R&D environments.

This advanced Probe Stage is a vital tool for the growing optoelectronics and display research sectors in key regions including Southeast Asia, the Middle East, Russia, and Africa. It serves university research groups, corporate R&D labs, and national institutes focused on organic electronics, compound semiconductors, and next-generation display technologies.

1. How is this Probe Stage configured for OLED testing?
   The stage provides stable electrical contact to the device's anode/cathode while allowing emitted light to pass through the top window to a spectrometer or the integrated photodiode. Temperature control lets you study efficiency roll-off, color shift, and lifetime at different temperatures.

2. What is the purpose of the custom silicon optical module?
   The integrated silicon photodiode allows for direct, in-situ measurement of optical power or spectral response within the 190-1100nm range as the device is electrically driven, eliminating alignment issues with external sensors.

3. How does the system prevent condensation during sub-zero testing?
   The included gas purge (dry air or nitrogen) attachment continuously flows dry gas across the interior window surface, effectively preventing frost and condensation that would block optical measurements.

4. Can this stage be used for other devices besides OLEDs?
   Absolutely. This versatile Probe Stage is ideal for any temperature-dependent electrical or optoelectronic characterization, including semiconductor diodes, lasers, photodetectors, and thin-film transistors.

5. Is the system a complete solution?
   Yes. The basic configuration is a turnkey system including the probe stage, temperature/cooling controllers, liquid nitrogen tank, chiller, and TNEX software. The custom silicon photodiode module is an integrated optional upgrade for optical measurements.