Electrical Probe Stage Compact Temperature Controlled Stage Robust For Microscope Observation

Product Details:
Place of Origin: Suzhou, China
Brand Name: GoGo
Certification: ISO 9001:2015 / ISO 14001:2015 / ISO 45001:2018
Model Number: EH800V
Payment & Shipping Terms:
Minimum Order Quantity: 1
Price: CNY 30000~600000/set
Packaging Details: Cardboard box + wooden box
Delivery Time: 30~60 work days
Payment Terms: T/T
Supply Ability: 1set/day
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Detail Information

Name: Probe Stage Cooling/Heating Method: Resistance Heating
Temperature Range: RT~800℃ Temperature Stability: ±0.1℃
Heating/Cooling Rate: Maximum Heating Rate:150℃/min,Controllable Cooling Rate Sample Holde: Stainless Steel;23mm*23mm
Optical Path: Reflection Top Window Size: φ25mm*1mm
Bottom Window Size: φ10mm*1mm(Transmitted Light Option) Window Material: JGS2 Fused Silica Glass (Transmission Range: 220 Nm - 2500 Nm), Manually Removable And Replaceable.
Window Defrosting: Gas Purge Attachment,Air Blowing Defrosting At Low Temperatures Distance From Window Upper Surface To Sample Holder Upper Surface: 7mm
Chamber Height: 6mm Probe: Magnetic Probe Holders*4 + Gold-plated Tungsten Steel Probes*4
Probe Port: BNC*4 Sample Stage Potential: Grounded
Chamber: Atmosphere Basic Configuration: TNEX*1、Electrical Heating Stage*1、 Temperature Controller*1、Recirculating Chiller*1、Cables、Tubing、and Accessories
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Electrical Probe Stage

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Compact Temperature Controlled Stage

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Temperature Controlled Stage Robust

Product Description

High-Temperature Electrical Probe Stage with RT to 800°C Range, ±0.1°C Stability, and 150°C/min Heating Rate for Microscope Observation

Product Name: GoGo EH800V High-Temperature Electrical Probe Stage for In-Situ Microanalysis (RT to 800°C)

Product Introduction

The GoGo EH800V is a high-performance Probe Stage engineered for precise electrical characterization of materials under elevated temperatures up to 800°C. Designed for in-situ studies, it allows researchers to simultaneously perform electrical measurements and conduct real-time microscope observation of sample behavior during thermal cycling. This integrated Probe Stage features four magnetic holders with gold-plated tungsten steel probes for stable electrical contact, all housed within a chamber optimized for clear optical access. Controlled by the advanced TNEX software, it is an essential tool for investigating the temperature-dependent electrical properties of semiconductors, ceramics, and functional thin films.

Key Advantages & Why Choose Our System

  • High-Temperature Electrical Testing Capability: This robust Probe Stage enables reliable electrical measurements (e.g., resistivity, I-V characteristics) at temperatures up to 800°C with exceptional stability of ±0.1°C, crucial for research on high-temperature electronics and materials.

  • Rapid Thermal Ramping with Precision: Achieves fast heating rates up to 150°C/min for efficient experimental workflows, while integrated active cooling ensures controllable temperature descent and protects the sample and stage integrity.

  • Integrated Optical-Electrical Analysis: The combination of reflection/transmission optical paths with high-quality JGS2 windows allows for direct visual correlation of microstructural changes with electrical data during heating and cooling cycles.

  • Stable and Flexible Probing System: Four magnetic probe holders provide secure yet adjustable positioning for accurate electrical contacts on the 23x23mm sample area, accommodating various device geometries and measurement configurations.

  • Complete, User-Friendly Solution: Supplied as a ready-to-use system with TNEX software for automated control, this Probe Stage offers a seamless setup for complex thermo-electrical characterization experiments.

Technical Specifications

Parameter Specification
Model / Brand EH800V / GoGo
Temperature Range RT ~ 800°C
Temperature Stability ±0.1°C
Max Heating Rate 150°C/min
Probe System 4 Magnetic Holders with Gold-plated Tungsten Probes
Electrical Interface 4 x BNC Ports
Optical Path Reflection & Transmission (Optional)
Control System TNEX Software Platform

Target Markets & Clients

This professional Probe Stage is strategically designed for research and development hubs in key growth regions including Southeast Asia, the Middle East, Russia, and Africa. It serves university laboratories, government research institutes, and high-tech industrial R&D centers focused on advanced materials, power electronics, and sensor technology.

Frequently Asked Questions (FAQ)

  1. What makes this Probe Stage suitable for high-temperature measurements?
    Its design ensures stable electrical contact and minimal signal interference at high temperatures. The use of appropriate materials for probes and shielding, combined with precise temperature control, allows for accurate data collection up to 800°C.

  2. Can I observe the sample while applying electrical signals?
    Yes. This Probe Stage is specifically designed for concurrent operation. The top viewing window allows you to monitor the sample and probe contacts in real-time throughout the electrical testing and thermal cycling process.

  3. How does the software integrate with my measurement equipment?
    The TNEX software controls the temperature profile. You connect your source meter or parameter analyzer to the stage's BNC ports and synchronize your electrical measurements with the thermal steps programmed in TNEX for automated data collection.

  4. Is the system compatible with my existing microscope?
    Yes. The compact and standardized design of the Probe Stage ensures compatibility with most optical and metallurgical microscopes, facilitating easy integration into your existing laboratory setup.

  5. What is included for immediate operation?
    The system is delivered as a complete workstation, including the probe stage, temperature controller, recirculating chiller, TNEX software, and all necessary cables, tubing, and accessories.

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