High Precision Cryogenic Probe Station Low Noise Probing Station For Semiconductor Device Testing

Product Details:
Place of Origin: Suzhou, China
Brand Name: GoGo
Certification: ISO 9001:2015 / ISO 14001:2015 / ISO 45001:2018
Model Number: ECH400V-EB
Payment & Shipping Terms:
Minimum Order Quantity: 1
Price: CNY 30000~600000/set
Packaging Details: Cardboard box + wooden box
Delivery Time: 30~60 work days
Payment Terms: T/T
Supply Ability: 1set/day
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Detail Information

Name: Cryogenic Probe Station Cooling/Heating Method: Liquid Nitrogen Cooling,Resistance Heating
Temperature Range: -190℃~400℃ Temperature Stability: ±0.1℃
Heating/Cooling Rate: Maximum Heating Rate:150℃/min,Maximum Cooling Rate:40℃/min Sample Holder: Silver ;23mm*23mm
Optical Path: Reflection Top Window Size: φ25mm*1mm
Window Material: JGS2 Fused Silica Glass (Transmission Range: 220 Nm - 2500 Nm), Manually Removable And Replaceable. Distance From Window Upper Surface To Sample Holder Upper Surface: 16.5mm
Chamber Height: 15mm Probe: Gold-Plated Tungsten Carbide Coaxial Probes*4
Probe Adjustment: XYZ Travel: ±6mm Probe Port: Triaxial BNC*4
Sample Stage Potential: Grounded Or Electrically Floating Chamber: Vacuum
Dimensions: 430mm*430mm*60mm Net Weight: 10.5kg
Basic Configuration: TNEX*1、Externally Adjustable Probe Station*1、 Temperature Controller*1、Cooling Controller*1、Liquid Nitrogen Tank*1、Recirculating Chiller*1、Cables、Tubing、and Accessories Optional: Adapter Plate/Customized Liquid Nitrogen Tank/Customized Recirculating Chiller/Vacuum System/Customized Probe/Customized Probe Port/Computer Host/ Customed Temperature Control Software
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High Precision Cryogenic Probe Station

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Cryogenic Probe Station Low Noise

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Low Noise Probing Station

Product Description

High-Precision Cryogenic Probe Station with External XYZ Movement, Low-Noise Triaxial BNC Current, and Precise Control from -190℃ to 400℃

Product Title: GoGo ECH400V-EB High-Precision Cryogenic Probe Station with External XYZ Manipulation (-190°C to 400°C)
Product Introduction

The GoGo ECH400V-EB represents a significant advancement in electrical characterization, engineered as a fully integrated cryogenic Probe Station for the most demanding semiconductor device testing and materials research. It provides precise temperature control from -190°C to 400°C within a high-vacuum chamber, essential for eliminating thermal drift and environmental interference. Its defining innovation is an external, bellows-connected translation stage that enables XYZ precision movement of its four low-noise probes without compromising the vacuum or thermal stability. This sophisticated Probe Station, controlled by the unified TNEX software, is designed for researchers who require unparalleled accuracy in low-current and low-noise electrical measurements.

Key Advantages & Why Choose Our Probe Station
  • External Precision Probe Manipulation: The external XYZ stage (±6mm travel) allows for ultra-fine, real-time probe positioning onto the sample from outside the vacuum chamber. This eliminates the need to vent and thermally cycle the system for adjustments, saving hours of experiment time and ensuring perfect, repeatable contact.

  • Engineered for Ultra-Low-Noise Measurements: Equipped with four gold-plated tungsten carbide coaxial probes and triaxial BNC connections, this Probe Station is architected to shield against electromagnetic interference and minimize leakage currents. This is critical for accurate characterization of nano-devices, photodiodes, and other components where signal integrity is paramount.

  • Broad Thermal Range with Rapid Cycling: Leverages efficient liquid nitrogen cooling and fast resistive heating (150°C/min) to enable comprehensive testing across cryogenic to elevated temperatures with excellent ±0.1°C stability, simulating real-world device operating conditions.

  • Complete Vacuum Integrity for Sensitive Samples: The dedicated vacuum chamber protects air-sensitive materials (e.g., perovskites, 2D materials) and prevents condensation during cryogenic operation, ensuring data reflects intrinsic material properties.

  • Certified Quality & Centralized Digital Control: Manufactured under ISO 9001, 14001, and 45001 certified processes. The TNEX software platform offers seamless control over all parameters, enabling the automation of complex temperature-electrical test sequences.

Technical Specifications
Parameter Specification
Model ECH400V-EB
Application Focus Low-Noise Semiconductor & Advanced Device Testing
Temperature Range -190°C to 400°C
Stability ±0.1°C
Probe System 4 Externally Adjustable XYZ Coaxial Probes
Electrical Interface 4 x Triaxial BNC Ports
Chamber High Vacuum
Viewport Top Window, φ25mm, JGS2 Fused Silica
Control System TNEX Software Platform
Target Markets & Clients

This advanced Probe Station is tailored for the sophisticated R&D ecosystems in key growth regions including Southeast Asia, the Middle East, Russia, and Africa. It is an indispensable instrument for university nanotechnology labs, corporate semiconductor research centers, and national physics institutes.

Frequently Asked Questions (FAQ)
  1. What is the main benefit of an externally adjusted Probe Station?
    External adjustment allows you to perfectly align probes onto micron-scale device pads while the sample remains under stable vacuum and temperature conditions. This prevents thermal cycling between adjustments, drastically improving throughput and measurement consistency.

  2. Why are triaxial BNC connections important?
    Triaxial (triax) connections provide a guarded signal path, dramatically reducing noise, crosstalk, and parasitic capacitance. This is essential for measuring femtoampere-level currents or making high-impedance measurements common in advanced semiconductor characterization.

  3. What types of devices can be tested with this system?
    This Probe Station is ideal for transistors (FETs, HEMTs), photonic devices, MEMS, quantum dots, and novel material (e.g., graphene, TMDC) devices that require electrical testing under variable temperature and vacuum conditions.

  4. Is the system compatible with my existing parameter analyzers?
    Yes. The triaxial BNC ports are standard interfaces. You can directly connect leading brands of semiconductor parameter analyzers, source measure units (SMUs), and LCR meters to the station.

  5. What does the basic configuration include?
    The system is delivered as a complete workstation, including the main probe station with external manipulators, temperature and cooling controllers, a liquid nitrogen tank, a recirculating chiller, TNEX software, and all necessary cabling and accessories for immediate operation.

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